XT V 130 and XT V 160 With sub-micron feature recognition, the XT V system range meets today’s need for high performance, non-destructive inspection of complex electronic components. Nikon’s Xi Nanotech X-ray source paired with industry leading flat panel detectors produces best-in-class image quality, with seamless transition between 2D ...

XT V 160 X射线和CT系统具有亚微米特征识别功能，适用于广泛的行业，包括电子、医疗、汽车、航空航天、消费品等。 Nikon’s XT V range comprises world-class X-ray and CT systems for non-destructive inspection of electronic components.

The XT V 160 is specifically designed for use in production lines and failure analysis laboratories. With a precision joystick, system users control the 5-axis sample manipulator. Real-time X-ray allows them to intuitively navigate complex printed circuit boards and electronic components and quickly trace defects.

XT V 160 X射线和CT系统具有亚微米特征识别功能，适用于广泛的行业，包括电子、医疗、汽车、航空航天、消费品等。 尼康的Xi Nanotech X射线源由于其独家的整体式发生器设计和无与伦比的160kV与20W目标功率而具有独家和市场领先的特点。 High.Contrast Filter 通过在单幅清晰图像中同时保证高低对比度区域的出色图像质量，从而揭示射线图像中的隐藏细节。 操作员现在可以比以往更快地识别样品的各个方面，从而优化和提高效率. 同类最佳的检测面积与占地面积比，可 …

Declaration of conformity - Provides the declaration of conformity for the named machine. This manual covers the following model: XT V 160. It is extremely important to read ALL safety information and instructions and any accompanying documentation before operating the system.

XT V160尼康 X-TEK xray检测设备 简要描述：尼康 X-TEK xray检测设备 XT V 160系统范围具有亚微米特征识别功能，可满足当今对复杂电子元件进行高性能、无损检测的需要。

The XT V systems feature 160 kV maximum energy, 20W true-target power, over 2000x geometric magnification, and sub-micron defect recognition. The XT V inspection systems house sample sizes up to 711mmx762mm (28×30″) and a maximum sample weight of 5kg, with detector options allowing large detection areas (25cmx20cm) and efficient imaging up ...

尼康xt v系列包括用于电子元件（pcb、bga、芯片设计等）无损检测x射线和ct检测系统。 XT V 130和XT V 160 XT V系统范围具有亚微米特征识别功能，可满足当今对复杂电子元件进行高性能、无损检测的需要。

The XT V 160 has a focal spot size of 1 μm and can inspect devices and create images with a precise resolution of 3840 x 2160 pixels. It has a 16-bit flat panel detector that produces best-in-class image quality, with seamless transition between 2D and 3D.

nikon Metrology’s latest XT v 160 nF is a high-precision, flat-panel based X-ray inspection system that facilitates real-time imaging and defect analysis dedicated to the electronics industry.