The FTIR spectrum of the sample confirms the presence of SiO2. The X-ray diffraction (XRD) shows that the sample is cristobalite type of SiO2 which is comparable with ICSD ref. number …

XRD patterns of pure SiO2 (a), the SiO2@YVO4:Yb 3+ ,Er 3+ samples (b), bulk YVO4:Yb 3+ ,Er 3+ powders annealed at 700 @BULLET C (c). [...] In this paper, the core–shell structured...

Crystallite size and lattice strain were analyzed using several methods: modified Scherrer, Williamson-Hall, and Size-Strain Plot. Fig. 1 shows XRD spectra of SiO2 annealed at 800 °C …

2015年1月1日 · In this paper, silica nanoparticles were synthesized from tetraethylorthosilicate (TEOS) as a precursor and PVP as a surfactant by employing sol-gel method. By XRD …

2004年7月1日 · In the (Ge:SiO 2)/SiO 2 multilayers annealed, we observed the splitting (fine structure) of X-ray diffraction (XRD) peak of Ge nanocrystals. In view of the analyses on XRD, …

纳米SiO2颗粒的物相研究. 温度在400一800°C,保温时间为3h时,对热解稻壳得到的SiO2粉体样品进行XRD检测分析,发现在400°C和500°C时,得到的样品中存在一些未燃烬的碳,将温度升高 …

样品1取样于单晶硅样品，比较样品1的衍射图与标准单晶硅的衍射图，存在非常大的差距，由此可认为该样品不是单晶硅。 样品2取样于SiO2，观察样品2的衍射图，发现没有明显的突触，说 …

x射线衍射（xrd）是一种常用的技术，可用于分析纳米材料的晶体结构。本文将介绍纳米二氧化硅在xrd衍射图谱中的标准峰值，以便科研人员和工程师更好地理解和分析该材料的结构性质。 …

通过硅酸钠溶液与H2SO4溶液的中和反应，优化了合成无定形SiO2颗粒的实验条件。 通过XRD、FT-IR、FE-SEM、EDS和微电泳对无定形SiO2颗粒进行表征。 无定形峰位于 XRD 图中的 2θ = …

XRD patterns of the SiO2, Bi@SiO2 and AC-Bi@SiO2 nanoparticles are shown in Fig. 2. Fig. 2a shows that bare SiO2 indicated that no SiO2 diffraction peaks and broad hump showing that …