2021年4月11日 · In present work, time-differential perturbed angular correlation (TDPAC) spectroscopy along with XRD has been utilized to study the electronic structure of STO. TDPAC is a radioisotope probe-based hyperfine interaction-based technique for studying chemical environment around the probe atom [24].

Fig. 2 (a) shows the phase compositions of STO and NSTO targets verified by XRD, both of which present only one titanate phase with the typical perovskite structure. However, compared to STO...

2015年3月6日 · In this paper, we investigate the surface properties of poly-crystalline SrTiO 3 (STO) and pursue an atomically smooth surface for poly-crystalline TMO thin film growth. STO was chosen as it is...

2021年8月9日 · Structural investigation of SRO films on STO using XRD. ( a ) displays the tilting of the RuO \(_6\) octahedra of an orthorhombic SRO film on a cubic STO. ( b ) CTR of the SRO( t )/STO...

2023年4月15日 · The crystalline quality, microstructure, surface morphology and optical properties of β-Ga 2 O 3 thin films have been systematically investigated by various techniques such as X-ray diffraction (XRD), atomic force microscope (AFM), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), Raman and photoluminescence (PL ...

2021年12月1日 · The preferred orientation of STO films and the rocking curves of STO grains along different orientations were detected by an X-ray diffraction system (XRD, Bruker D8 Discover with GADDS), whose X-ray source is a monochromatic Cu-Kα radiation at wavelength of 1.5406 Å. The tube accelerating voltage and current were set as 40 kV and 40 mA ...

We report on the integration of epitaxial colossal magnetoresistive La0.67Ba0.33MnO films on Si (100) semiconductor using SrTiO3 template layer by pulsed-laser deposition. X-ray diffraction reveals...

We studied the effect of 200 MeV Ag+15 ion irradiation on structural, magnetic, and electrical transport properties of LaCoO3 thin films. LaCoO3 thin films deposited on SrTiO3 (100) single crystal...

2016年12月30日 · The X-ray diffraction (XRD) analysis was carried out using a Panalytical X’Pert Pro Cu Kα radiation source (λ Cu = 0.15405 nm) in the θ–2θ geometry. Thicknesses of the films were determined by small angle X-ray reflectivity.

钛酸锶(SrTiO3，以下简称STO)是一种重要的电子材料，是典型的钙钛矿结构氧化物，具有丰富的物理现象。在105K，单晶STO发生立方(Pm3m)-四方(I4/mcm)结构相变，由TiO6八面体沿长轴旋转引起，相邻的两个TiO6八面体旋转方向相反，晶体单胞对称性降低且体积变大。