2017年7月5日 · We report direct evidence that oxygen vacancies affect the structural and electrical parameters in tensile-strained NdNiO 3−δ epitaxial thin films by elaborately adjusting the amount of oxygen...

X-ray diffraction (XRD) results show that all the CuI films possess a zinc-blende structure.

Download scientific diagram | (a) XRD ( θ − 2 θ ) scans around the LSAT [002] peak (K α 1 /K α 2 ), K α 1 (2 θ = 46.985 LSAT [002] marked by asterisk) from publication: Tuning cationic ...

We also prepared FeSe on LSAT with LAO buffer, to control the magnitude of strain. The a-axis and the c-axis lengths of the films were determined from the (204) and (00l) reflections in the X-ray...

2017年12月30日 · In summary, high quality single crystalline TiO 2:Nb films were successfully deposited on LSAT (100) substrates by MOCVD. The results of XRD and HRTEM analyses indicated that the films were epitaxially grown along the a-TiO 2 (001) orientation with an in-plane epitaxial relationship of a- TiO 2 [010] || LSAT [010].

(LSAT) is one of the widely used cubic perovskite substrates with a lattice parameter of 3.868 Å. The lattice mismatch of VO 2 and LSAT is relatively small, -5.17% and 1.59% in a-and c-axis direction, respectively. Hence, LSAT can be a good candidate for epitaxial growth of …

2021年4月7日 · Using a combination of X-ray diffraction (XRD) with reciprocal space maps (RSMs), scanning probe microscopy, and transmission electron microscopy (TEM), we find that the use of this approach not only enables the growth of high-quality BFO epitaxial thin films, but also provides the ability to generate a desired strain that can induce phase ...

2017年5月1日 · In this review, we summarize the surface treatment procedures to accomplish atomically flat surfaces with single terminating layer for various metal oxide substrates. We particularly focus on the substrates with lattice constant ranging from 4.00 Å to 3.70 Å, as the lattice constant of most perovskite materials falls into this range.

2016年8月4日 · Figure 1 (a) shows a symmetric ω /2 θ x-ray diffraction (XRD) scan for the LSAT (100) substrate obtained with Cu K α1,2 radiation on a PANalytical Empyrean diffractometer. Miller indices are marked in the SC notation, where all (hkl) reflections are allowed. The lattice constant was determined to be 3.870 ± 0.002 Å.

2021年10月29日 · We fabricated a 1.7% tensile-strained SMO thin film with a thickness of 20 nm on an LSAT substrate utilizing pulsed laser deposition (PLD) and fabricated films with various thicknesses (45, 69,...