– KGDS test speed requirement continues to increase (from 800MHz to 3.2GHz) – As AP IC demand increases, KGDS test solution requires better test efficiency to reduce cost and support higher volume – FFI HFTAP probe card technology has validated on production test passed 3.0GHz speed and achieved max 128 DUT.

advanced test automation will be essential in ramping 3D systems to volume production. This whitepaper discusses some of the key test challenges related to 3D integrated systems, and how Synopsys’ synthesis-based test solution can be used to rapidly address these challenges. 2.5D and 3D Integration

The Acronym, KGD, was coined in the late 1980s to identify bare die that were subjected to additional electrical testing and/or stress screenings following singulation to verify that the die are in fact electrically “good”. Significant interest in and requirements for KGD coincided with the increased activity in Multichip

Comprehensive KGD test cells fulfill static and dynamic test requirements of low- and high-power devices at KGD level. They include precise parametric testing, optical test, automatic handling from and to the diced wafer, device contacting, and temperature conditioning.

Known Good Die (KGD) testing plays a pivotal role in ensuring the reliability and performance of individual die, particularly in the production of high-performance devices such as Silicon Carbide (SiC). By identifying defective die early in the manufacturing process, KGD testing minimizes the risk of costly downstream failures and enhances ...

Abstract: The fastest growing technology to manufacture high quality known good die (KGD) is the usage of test methods at wafer probe level. Test methods include enhanced voltage screens and I/sub DDQ/ and temperature tests at the wafer level.

The term “known good die” (KGD) has always generated more heat than light. The original intent of the phrase was to signify that bare die or unpackaged ICs had the same quality and reliability as equivalent packaged devices, and could be shipped …

KGD tests create specific electrical, mechanical and physical challenges. Therefore, CREA and Infotech established a collaboration in order to create an all-in-one solution. Each company is firmly specialized in their own field. Due to each’s specialization, their collaboration has resulted in aboth ground-breaking and successful test station.

Accuracy and efficiency of Die Sort, so-called Known-Good-Die (KGD) test, directly impact product yield, cost, and fabrication cycle time. Over years of KGD test results analysis, we observed a variety of false failures due to KGD tester malfunctioning, flawed test scheme, or bad electric contact between test probe and die bond pad.

• KGD "Power" test shows its specific challenges from electrical, mechanical and physics point of view • 3 individual companies - each deeply specialized in their field -have successfully created a turnkey solution • end customer has been relieved of …