
X-ray diffraction of ITO film deposited onto glass
The X-ray diffraction (XRD) pattern confirmed the polycrystalline nature of the CuONPs. The prepared CuONPs in powder form were blended with ZnO powder and utilized as an anode …
High-temperature optical properties of indium tin oxide thin …
2020年7月27日 · Indium tin oxide (ITO) is one of the most widely used transparent conductors in optoelectronic device applications. We investigated the optical properties of ITO...
Structure, optical and electrical properties of indium tin oxide …
2016年3月1日 · The structural parameters of spray coated ITO films were analyzed by X-ray diffractometer (XRD) using the PANalytical system with Cu Kα 1 radiation (k = 1.54056 Å). …
X-ray diffraction patterns of ITO thin films for different Sn...
Indium tin oxide (ITO) thin films have been prepared by jet nebulizer spray pyrolysis technique for different Sn concentrations on glass substrates. X-ray diffraction patterns reveal that all the...
powders by solid-state reaction method, ITO was prepared. Using electron beam gun technology, ITO films with different thicknesses were prepared. The influence of film thickness on …
Characterization and Structural Property of Indium Tin Oxide Thin …
Discover the impact of thickness on Indium Tin Oxide (ITO) thin films. XRD and XRR analysis reveal crystalline structure and increased domain size. Explore the relationship between …
The key of ITO films with high transparency and conductivity: Grain ...
2022年2月10日 · X-ray diffraction (XRD) patterns were performed on a Shimadzu XRD-7000 diffractometer with a Cu Kα source operating at 40 kV and 30 mA. Scanning electron …
Structural and morphological properties of ITO thin films …
2015年10月7日 · Physical properties of transparent and conducting indium tin oxide (ITO) thin films grown by radiofrequency (RF) magnetron sputtering are studied systematically by …
XRD patterns for ITO thin films deposited for 40 min
Characterization of the deposited hydrogenated amorphous ITO thin films are made using X-ray diffraction (XRD), atomic force microscopy (AFM), four probe electrical conductivity,...
ITO 薄膜的微结构及其分形表征 - 百度文库
摘 要:采用直流磁控溅射法制备氧化铟锡 (ITO)薄膜,用 XRD,TEM 和分形理论测试和分析了不同退火时 间 ITO 薄膜的微结构.XRD 分析表明:退火时间持续增加,薄膜的晶格常数先减小后略有增 …
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