XRD （X-ray Diffraction）中文全称是 X射线衍射，是一种快速、准确、高效的材料无损检测技术。 作为一种表征晶体结构及其变化规律的手段，其应用遍及材料、化学、生物、医药、陶瓷、冶金、矿产等诸多领域。

2021年10月13日 · X-ray diffraction (XRD) is an indispensable tool for characterising thin films of electroceramic materials. For the beginner, however, it can be a daunting technique at first due to the number of operation modes and measurements types, as well as the interpretation of the resultant patterns and scans.

X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.

2024年1月10日 · 高分辨率 X 射线衍射 (HRXRD) 是一种强大的无损检测方法，其研究对象主要是单晶材料、 单晶外延薄膜 材料以及各种 低维半导体异质结构。 普遍用于单晶质量、外延薄膜的厚度、组分、晶胞参数、缺陷、失配、弛豫、应力等结构参数的测试。 现代HRXRD与常规XRD的区别主要体现在：（1）高度平行且高度单色的高质量X射线；（2）不仅要测试 倒易格点 的位置（角度），还要测试倒易格点的形状（缺陷）；（3）更高的理论要求-动力学理论。 GaN做第三 …

X-ray diffraction (XRD) is a powerful analytical tool for industry professionals and material scientists. A source (typically copper) produces x-rays which are directed at a flat sample. …

X-ray powder diffraction (XRD) is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.

2023年9月4日 · X-ray diffraction (XRD) is a non-destructive technique for analyzing the structure of materials, primarily at the atomic or molecular level. It works best for materials that are crystalline or partially crystalline (i.e., that have periodic structural order) but is also used to study non-crystalline materials.

本文介绍了X射线衍射 (XRD)分析中的连续扫描和步进扫描技术。 连续扫描适用于大范围定性分析，通过调整扫描速度和数据点间隔获取全谱信息，实验时间相对较短。

In this tutorial article, we provide a foundation for the thin-film engi-neer/scientist conducting their first measurements using XRD. We give a brief introduction of the principle of difraction and description of the instrument, detailing the relevant operation modes.

在进行XRD（X射线衍射）测试时，步长和扫描速度是两个重要的参数，它们虽然相关但并不相同。 步长（Step Size）指的是在XRD扫描过程中，每步扫描的角度间隔。