The FTIR spectrum of the sample confirms the presence of SiO2. The X-ray diffraction (XRD) shows that the sample is cristobalite type of SiO2 which is comparable with ICSD ref. number …

2015年1月1日 · The XRD pattern of SiO2 was obtained using X-ray diffractometer (Schimadzu Model: XRD 6000) with CuKα radiation in the range of 20-80o (λ=0.154nm). The surface …

The addition of nano crystalline SiO 2 particles (X-ray diffraction (XRD) pattern is shown in Figure 1) was carried out exactly before the casting process in the carbon steel die. In order to...

The electrochemical capacitive performance of WSB-derived carbon was further enhanced through hybridization with silicon dioxide (SiO2) as a cost-effective pseudocapacitance material.

2017年11月14日 · Here we show in situ pump-probe X-ray diffraction measurements on fused silica crystallizing to stishovite on shock compression and then converting to an amorphous …

The X-ray diffraction (XRD) shows that the sample is cristobalite type of SiO 2 which is comparable with ICSD ref. number of 01-076-0941. The crystallite size is about 28 nm as …

2020年11月10日 · In this study, the SiO 2 nanoparticles have been modified with 3-isocyanatopropyltriethoxy-silane (ICP), and the effect of foam stability has been investigated. …

Amorphous SiO 2 particles were characterized by XRD, FT-IR, FE-SEM, EDS and microelectrophoresis. The amorphous peak was located at 2θ = 21.8º in the XRD pattern. …

The electrochemical capacitive performance of WSB-derived carbon was further enhanced through hybridization with silicon dioxide (SiO2) as a cost-effective pseudocapacitance material.

2020年3月1日 · Firstly, the values of 2θ in X-ray diffraction (XRD), BET and Langmuir of fourteen batches of SiO 2 were precisely assayed. And then a model that represented the correlation …