In-situ micro-area analysis of precisely polished polycrystalline diamond (PCD) film by high-speed three-dimensional dynamic friction polishing (3DM-DFP) is carried out in this work, continuing...

1996年8月1日 · Low angle X-ray diffraction (XRD) performed on a separate PCD tool blank confirmed the presence of diamond, tungsten carbide, tungsten and both the low and high temperature phases of cobalt. The high temperature cobalt phase may be quenched in during cooling from the high temperature-high pressure processing conditions.

2020年4月15日 · The D/max-2550X X-ray diffraction (XRD) (CuK α: 40 kV, 200 mA) was conducted to investigate the phase structures of Ti-coated diamond powders and annealed Ti-PCD. The compositions of the annealed Ti-PCD were determined by a LabRAM HR Evolution Raman spectrometer with a 514.5 nm wavelength of the Ar + laser.

2011年1月1日 · Scanning electron microscopy (SEM) analysis of morphology shows that the dense microstructure with diamond–diamond (D–D) direct bonding has formed in the PCD layer. X-ray diffraction (XRD) performed in the cross-section of PCD confirmed the presence of diamond, nickel-based alloy, WC and Co x W x C.

XRD results consist of qualitative analysis, and semi-quantitative analysis, including preferred orientation by manipulation of the growth parameter, α, and using Bragg-Brentano method. The results show that comparison of the PCD grown on two substrates, Si3N4 and WC, shows Si3N4 preferes (111) planes more than

2019年12月9日 · We report the simultaneous enlarged growth of seven single crystal diamond (SCD) plates free from polycrystalline diamond (PCD) rim by using a microwave plasma chemical vapor deposition (MPCVD) system. Optical microscope and atomic force microscope (AFM) show the typical step-bunching SCD morphology at the center, edge, and corner of the samples.

2019年9月27日 · PCDs were characterised by photoluminescence (PL), Fourier transform infrared (FTIR) spectroscopy, transmission electron microscope (TEM), and X-ray diffraction (XRD) techniques. The diamond surface was also polished to bring the as-grown micron level of surface roughness (detrimental for wear application) down to few hundreds of nanometer.

This study focuses on the XRD analysis of Polycrystalline diamond (PCD) deposited on two different substrates i.e. Si 3 N4 and WC only. The analysis of XRD results consist of qualitative analysis, and semi-quantitative analysis, including preferred orientation, crystallite size and strain.

The polycrystalline diamond (PCD) composites were synthesized from Si-coated diamond or diamond powder mixtures with Si. The characterizations of phase structures, morphologies and thermal stability of PCD were investigated by x-ray diffraction (XRD), scanning electron microscopy (SEM) and thermal gravimetric-differential scanning calorimetry ...

2021年1月3日 · X-ray diffraction (XRD) techniques are powerful, non-destructive characterization tool with minimal sample preparation. XRD provides the first information