Scanning electron microscopy images and X-ray diffraction analysis indicated that most of the mullite (3Al2O3.2SiO2) in the CFA was transformed into godovikovite (NH4Al (SO4)2) and quartz (SiO2)...

Fourier Transform Infrared (FT-IR), X-Ray Diffraction (XRD) and Transference Number Measurement (TNM) techniques were applied to investigate the complexation, structural, ionic transport ...

2009年5月5日 · X-ray diffraction (XRD) experiments on the different (NH 4) 2 SO 4 + (NH 4)H 2 PO 4 and (NH 4) 2 SO 4 + (NH 4)H 2 PO 4 + ZnO powder mixtures were performed using a laboratory powder diffractometer (D8 Advance, Bruker, Spain) configured in the Bragg–Brentano geometry, and equipped with a secondary graphite monochromator, and divergence, anti ...

Quantitative chemical analysis of (NH4 )2 SO4 /(NH4 )H2 PO4 is time consuming and we present here two alternative instrumental analysis methods that yield simultaneously the amount of (NH4 )2 SO4 and (NH4 )H2 PO4 in a mixture, by simple applications of …

2003年4月15日 · FTIR spectroscopy and XRD analysis reveal the presence of crystalline Si particles and SiO x, both originating from the excess of Si. The (NH 4) 2 SiF 6 WP phase emits an intense photoluminescence (PL) band, shifted towards higher energies as compared to the starting PS layer.

The XRD results show that a MR higher than the stochiometric value (MR >2) is most efficiency to obtain high quality portlandite (P2.5 and P3).

2024年9月15日 · The ammonium fluorosilicate has been investigated by Synchrotron powder X-ray diffraction (XRD) and Raman spectroscopy experiments with diamond anvil cells (DAC) up to 20 GPa at room temperature. The experimental results show that a phase transition from the cubic phase ( Fm 3 ¯ m ) to the trigonal phase ( P 3 ¯ m1 ) occurs at 0.3 GPa with a ...

2019年6月17日 · Inspired by this, we show that our 2D layered perovskite-like (NH 4) 3 Bi 2 I 9 device provides unique anisotropic X-ray detecting performance with different crystal directions, effective...

2019年11月1日 · 摘要通过线性扫描伏安法（lsv），电化学阻抗谱（eis）研究了（nh4）2so4浓度（c（（nh4）2so4））对不同电位范围的不锈钢（ss）上析氢和mn电沉积的影响，恒电位极化，计时电流法，扫描电子显微镜（sem）和x射线衍射（xrd）技术。

The obtained samples were characterized by X-ray powder diffraction (XRD), X-ray fluorescence (XRF), magic angle spinning nuclear magnetic resonance (MAS NMR), field emission scanning electron microscopy (FESEM), selected area electron diffraction (SAED), and transmission electron microscopy (TEM).