Non-ambient X-ray diffraction (NA-XRD) is an advanced technique used to study materials under non-ambient conditions, such as changes in temperature, pressure, humidity, and more.

XRD（X-ray Diffraction）中文全称是 X射线衍射 ，是一种快速、准确、高效的材料无损检测技术。作为一种表征晶体结构及其变化规律的手段，其应用遍及材料、化学、生物、医药、陶瓷、冶金、矿产等诸多领域。

2020年5月15日 · We have investigated the high-pressure behavior of sodium oxide (Na2O) up to 30 GPa by synchrotron angle-dispersive powder X-ray diffraction in a diamond anvil cell at room temperature.

XRD results indicate that all of the diffraction peaks of the obtained sample are consistent with the standard pure phase of La2O2S2 with an optimal molar ratio (La2O2SO4:S:Na2CO3 = 1:30:5) and...

Characterization techniques, including XRD, FTIR, and EDS allowed to identify the spiropyran molecules covering the surface of ZHC in the merocyanine form, forming active sites for calcium...

本导论简要介绍了非环境 X-射线衍射 (NA-XRD)。 内容涵盖仪器、分析和数据解析与应用。 本文不限定于特定非环境 X-射线衍射仪器或某个特殊领域，而是对主要仪器与应用进行全面性的概述。 您是否需要一份印刷版的非环境导论？ The guide is sent as hardcopy to the given address. Please check if your postal address is complete to avoid incorrect delivery. 通过选择“Submit”，您同意Anton Paar可以使用您的个人数据来满足您的要求，并履行对您的合同义务。 进一步的 …

This free guide gives you a general introduction to non-ambient X-ray diffraction (NA-XRD). The content spans from instrumentation, analysis, and data interpretation to applications.

2020年9月5日 · 本文总结了NaxMO2正极材料的结构演变、电化学性能的最新进展。 旨在阐明结构演变与电池性能 (循环性能、倍率性能和能量效率)的关联。 此外，本文还提出了几种策略来缓解这种问题。 Due to the abundance of sodium resources, sodium-ion batteries (SIBs), as rechargeable batteries, have received increasing attention, especially for large-scale energy storage systems.

2022年5月2日 · 采用阳极侧以铍为X射线窗的Swagelok电池进行了原位XRD测试，电池测试电流密度为38 mA g−1，电压窗口为0.01~1.5 V (vs. Na/Na+)。 原位FTIR-ATR光谱测量，以研究Bi电极上的溶剂共插层过程，所得结果如图1所示。 在原位FTIR-ATR测试过程中同时进行CV测试，电压窗口为0.01~1.5 V (vs. Na/Na+)，扫描速度为0.2 mV/s，用于表征Bi电极的电化学行为，见图1a左图。 图1a右侧给出了不同电位下原位FTIR/ATR光谱的相应二维图。 三维原位FTIR-ATR光谱图 …

Temperature validation for non-ambient X-ray diffraction (NA-XRD) determines the relation between the temperature of the temperature sensor in the heating attachment and the true temperature on the surface of the sample. Besides others, two main methods for temperature validation are used in NA-XRD: