We used DC magnetron sputtering to deposit niobium nitride (NbN) on the copper foam (Cu foam) substrate to fabricate NbN@Cu foam. The fabricated NbN@Cu foam electrodes demonstrate a highly porous...

2019年6月19日 · High resolution X-ray diffraction (HRXRD) confirms of Nb 2 N as the majority phase along with a minority phase Nb 4 N 5. Further, R (T) measurements on Nb 2 N thin films varying in...

2017年3月15日 · The X-ray diffraction (XRD) pattern of Nb 2 O 5 NPs (Fig. 1a) indicates that all the peaks can be indexed to orthorhombic Nb 2 O 5 (PDF #71-0336). 29 The Nb 2 O 5 powder was found...

Niobium (Nb) thin films, which are potentially useful for integration into electronics and optoelectronics, were made by radio-frequency magnetron sputtering by varying the substrate temperature.

XRD pattern of the Nb 2 O 5 NFs obtained from the precursor PAN/Nb 2 O 5 composite fibers by calcination at 600 • C is shown in Figure 2a.

2019年4月29日 · X-ray diffraction (XRD) and Raman spectroscopy confirmed the tetragonal phase of NbO2 and orthorhombic phase of Nb2O5 for similar deposition temperatures. Scanning electron microscopy (SEM) observations indicate that NbO2 has a unique nanoslice structure while Nb2O5 has a flake-like structure.

2001年1月15日 · Here, we report on the molecular-beam growth of Nb thin films on SiO 2 substrates at various growth temperatures with the aim to grow single textured and very smooth Nb thin films. Ex situ X-ray diffraction (XRD) and atomic force microscopy (AFM) were employed to characterize the structural and morphological evolution.

X-ray diffraction (XRD) measurements which were carried out in the context of stress determination gave comparable results for the crystallinity of our Nb layers [8]. Figure II.2 shows XRD curves for 120 nm Nb films sputtered at different source

2021年1月15日 · Then, the crystal structure of Nb 2 C/ZnS composite was set side by side to the reacting species (Nb 2 C and ZnS) and analysed. The coexistence of XRD peaks of both the reactants and absence of any extra peak in the XRD pattern of composite, suggests the successful formation of MXene-ZnS nanocomposite.

2016年11月1日 · The morphology of the deposited films was examined by scanning electron microscopy (SEM, model JEOL-JSM-6480LV) and atomic force microscopy (AFM, Digital Instruments-Νanoscope IIIA). The crystalline quality of the films was investigated through X-ray diffraction (XRD, Rigaku diffractometer, model RINT 2000) using CuK α irradiation.