2019年9月26日 · In situ XRD shows that the bulk 2H-MoS 2 phase is converted to 1T-Li x MoS 2 upon discharge and that this change is only partially reversible upon charge. Furthermore, operando XRD identifies the nanosheet MoS 2 as the metastable 1T′ phase and shows that this phase is conserved upon discharge.

High-resolution transmission electron microscopy (HRTEM), Raman spectroscopy, x-ray diffraction (XRD) and x-ray photoelectron spectroscopy (XPS) were used to characterize both the 1T/2H-MoS 2...

2018年4月2日 · X-ray diffraction (XRD) characterizations (Fig. 1d,e) show that the peaks of 1T′-MoS 2 are shifted higher than those for 2H-MoS 2 (obtained by annealing 1T′-MoS 2 in an argon atmosphere at...

Transition metal dichalcogenide MoS2 nanoparticles have been synthesized by an inexpensive slow evaporation method. The X-ray diffractogram (XRD) showed that the grown particles are in...

2019年4月30日 · XRD result shows that the MoS 2 films are mixed metallic octahedral prismatic 1T- and trigonal prismatic bulk crystal 2H-phases. The I-V relationships show higher electrical conductivity for the films prepared at 400 °C and 450 °C than the films prepared at 425 °C.

2 天之前 · The XRD patterns of EG, EG/MoS 2, and EG/MoS 2 /PAA composite are shown in Fig. 3b. A sharp peak can be seen at 26.64°, which is related to the (002) plane of the graphene structure 28.

4 天之前 · Only hexagonal MoS 2 crystalline structures were apparent in the XRD patterns of MoS 2, MoS 2 /rGO hybrid, and MoS 2 /rGO hybrid in Fig. 2. The crystal planes of MoS2 (100), (103), and (110) were found using sharp patterning at 2 = 32.8 o, 39.8 o, and 58.5 o, respectively (JCPDS No.37-1492). There were also no further peaks in the sequence ...

To explore domain orientations in the MoS 2 films, we conducted second harmonic generation (SHG), transmission electron microscopy (TEM), and in-plane X-ray diffraction (XRD) measurements. The polarized SHG mapping is shown in Figure 2d .

2024年12月10日 · The present manuscript examines the significant effects of hydrogen (H₂) exposure on the structural properties of molybdenum disulfide (MoS₂) thin films through in-situ X-ray diffraction (XRD) analysis.

19 小时之前 · The crystalline phases of MoS 2 were analyzed using grazing incidence X-ray diffraction (XRD; PANalytical X’Pert Pro MRD) with Cu Kα radiation (λ = 0.15418 nm) at 2θ = 5°–70°, a scanning speed of 1.2°/min, and step increments of 0.02° at room temperature. The conductivity of the aqueous solution was measured using a conductivity ...