– KGDS test speed requirement continues to increase (from 800MHz to 3.2GHz) – As AP IC demand increases, KGDS test solution requires better test efficiency to reduce cost and …

advanced test automation will be essential in ramping 3D systems to volume production. This whitepaper discusses some of the key test challenges related to 3D integrated systems, and …

The Acronym, KGD, was coined in the late 1980s to identify bare die that were subjected to additional electrical testing and/or stress screenings following singulation to verify that the die …

Comprehensive KGD test cells fulfill static and dynamic test requirements of low- and high-power devices at KGD level. They include precise parametric testing, optical test, automatic handling …

Known Good Die (KGD) testing plays a pivotal role in ensuring the reliability and performance of individual die, particularly in the production of high-performance devices such as Silicon …

Abstract: The fastest growing technology to manufacture high quality known good die (KGD) is the usage of test methods at wafer probe level. Test methods include enhanced voltage screens …

The term “known good die” (KGD) has always generated more heat than light. The original intent of the phrase was to signify that bare die or unpackaged ICs had the same quality and …

KGD tests create specific electrical, mechanical and physical challenges. Therefore, CREA and Infotech established a collaboration in order to create an all-in-one solution. Each company is …

Accuracy and efficiency of Die Sort, so-called Known-Good-Die (KGD) test, directly impact product yield, cost, and fabrication cycle time. Over years of KGD test results analysis, we …

• KGD "Power" test shows its specific challenges from electrical, mechanical and physics point of view • 3 individual companies - each deeply specialized in their field -have successfully …