2022年2月10日 · X-ray photoelectron spectroscopy (XPS) surface analysis was obtained using a Shimadzu Kratos supra XPS analyzer. XPS spectra were measured with a monochromatic Al Kα (1486.71 eV) X-ray source, operating at 10 kV and 10 mA in the vacuum about 10 −8 Torr.

XPS measurements (figure 1) show that the surface composition of the ITO film is: O-55.1 at%, In – 40.6 at% and Sn – 4.3 at.%, which means that the film is indium rich.

2005年1月1日 · SEM and energy dispersive X-ray spectrometry (EDX) provides 3-D images and bulk chemical composition (Sn/In ratio) of the ITO powders. By use of TEM, primary particle sizes were measured, and the particle size distribution was determined.

2016年11月18日 · The XPS spectra show clearly the increase of the amount of Na within the ITO film with the increase of the reducing potential. The atomic percentage of Na + increases from 2% at −1.8 V to 5% at...

2020年4月1日 · In this study, ITO targets with different crystallinities were used to prepare ITO thin films (approximately 150 nm) under similar conditions using radio frequency (RF) magnetron sputtering. The crystal structure and element state of ITO targets and ITO thin films were analyzed by X-ray diffraction (XRD) and X-ray photoelectron (XPS), respectively.

2017年11月15日 · By precisely controlling the Sn doping, the ITO thin films present promising optical and electrical performances at either near-infrared-visible or visible-near-ultraviolet ranges. At low Sn doping level, the as-grown ITO possesses high electron mobility of 48.8 cm 2 V −1 s −1, which results in high near-infrared transmittance and low ...

Indium tin oxide (ITO) has been studied for applications at normal high temperatures, below 600°C, due to its excellent electrical characteristics.

Download scientific diagram | XPS spectra of pristine ITO-coated glass substrates (provided by Kintec): (a) O 1s spectrum, (b) In 3d 5/2 spectrum, (c) Sn 3d 5/2 spectrum, and (d) valence-band...

Effects of oxygen-flow rate, Sn con-tent, and heat-treatment temperature on electronic properties are studied and discussed. XPS measurements show that indium is in In3 charge state, and tin is only in Sn4+ state in indium-saving ITO thin films sput-tered at different conditions and heat-treated at different temperatures.

2009年4月13日 · 研究了辐照试验前后ito 样品的光电性能变化，并用xps和afm对其组分及表面形貌变化进行了分析。结果表明，辐照后ito薄膜的光学透过率变化不大；表面电阻有一定增加，但幅度不大，完全可以满足防静电的要求。