Graphene oxide (GO) and reduced graphene oxide (RGO) are known to have superior properties for various applications. This work compares the properties of GO and RGO with graphite.

In the XRD pattern of GO, the strong and sharp peak at 2θ = 11.7° corresponds to an interlayer distance of 7.6 Å (d002) (A). rGO shows two peaks: one small peak centered at 2θ = 11.7° and another broad peak at 2θ = 25.8°, corresponding to interlayer distances of 4.47 and 3.53 Å, respectively (B).Note: These XRD results are related to ...

2017年12月18日 · XRD, FESEM, Raman, FTIR spectrophotometer and TGA were used for characterization of GO and rGO. XRD images reveal crystalline structure for both GO and rGO. The d-spacing is observed to be reduced for rGO as compared to that for GO because of removal of oxygen containing functional groups.

In this study, an investigation on the characterization of reduced graphene oxides (rGOs) prepared from natural graphites with different graphitization degrees using Hummers method was conducted.

We introduced, for the first time, a membrane composed of nanostructured self-polyether sulphone (PES) filled with graphene oxide (GO) applied to photoelectrochemical (PEC) water splitting. This...

In the XRD pattern of GO, the strong and sharp peak at 2θ = 11.7° corresponds to an interlayer distance of 7.6 Å (d002) (A). rGO shows two peaks: one small peak centered at 2θ = 11.7° and another...

2018年2月23日 · We report a facile and cost-effective approach to develop self-standing reduced Graphene Oxide (rGO) film based optical sensor and its low-temperature performance analysis where midgap defect...

2020年10月22日 · Intrinsic fluorescence and versatile optical properties of Graphene Oxide (GO) in visible and near-infrared range introduce this nanomaterial as a promising candidate for numerous clinical...

2012年6月15日 · X-ray diffraction (XRD) is ideally suited to evaluate GO–polymer composite samples for evidence of intercalation or exfoliation of GO. Examples of GO–polymer analysis by XRD are presented, along with results that demonstrate the effect of …

2024年1月30日 · In contrast, the XRD pattern of rGO H reveals a sharp diffraction peak at 11.30° which is observed, corresponding to the (001) plane of GO. This presence of a (001) plane diffraction peak indicates that the starting material, graphite, was successfully oxidized into GO during the Hummers method.