2018年9月30日 · Here, the high-energy x-ray diffraction (HE-XRD) is used to investigate the structural properties for a series of polycrystalline Fe 100-x Ga x (14 ≤ x ≤ 31, at.%) alloys, which are rapidly cooled from the melt. The superlattice diffraction peaks have been quantitatively analyzed to determine the phase structures.

2022年10月19日 · In this work, magnetostrictive FeGa thin films have been deposited on a flexible Kapton sheet to exploit the magneto-elastic coupling effect and modify the magnetic properties of the sample. The...

2023年5月1日 · The crystal structure of the Fe 71 Ga 29 alloys were characterized by an X-ray diffractometer (XRD, X'pert Pro MPD) using Cu Kɑ radiation (λ = 1.54056 Å). The scanning angle was ranged from 20° to 90° and the scanning speed was 4°/min.

2023年3月28日 · From the RHEED and XRD patterns, we conclude that single bcc α-Fe phase FeGa films are successfully grown on the STO (001) substrate with [001] orientation. On the other hand, with the Ga content, the (002) diffraction peak position shifts to a smaller angle, indicating an increase in the c-axis lattice constant.

2022年3月22日 · The research was intended to optimize mechanochemical techniques to synthesize FeGa 2 O 4 particles. The XRD patterns revealed that the FeGa 2 O 4 particles were synthesized without any contamination elements or compounds. Replacement atoms in the tetrahedral and octahedral sites were analyzed by employing Reitveld refinement.

2020年2月15日 · Stoichiometry of FeGa films was determined using energy dispersive X-ray (EDX) spectroscopy and confirmed by Rutherford Backscattering. Crystal structure and epitaxial quality were determined by XRD using a Philips X-pert system.

XRD pattern of the powdered FeGa 3 sample at ambient conditions is shown in Good compositional homogeneity and a nominal stoichiometry of FeGa 2:97±0:03 were established from elemental maps...

2017年11月8日 · The structures for FeGa, FeGaN and FeGaB films with varied oblique angles were measured by XRD, which were shown in the Figs. S1 S3, S4 and S7 of the supplementary material, respectively. These XRD patterns revealed the similar results.

FeGa3 polycrystalline samples were synthesised using the gallium self flux method. The stoichiometry was confirmed via energy dispersive spectroscopy and the tetragonal crystal structure was...

2022年9月20日 · The structural characterization of the FeGa and FeGaNi films were investigated by using XRD. The oblique sputtering angle α dependent XRD spectra for FeGa and FeGaNi films are shown in Figure 2a,b, respectively. It can be clearly seen that all the films display a strong diffraction peak at 44.6° corresponding to the bcc (110) diffraction peak ...