拆解揭密首款高带宽内存内部架构（下）-电子工程专辑
2015年9月7日 · 韩国内存芯片制造商海力士 (SK Hynix)在2014年初发布其高带宽内存 (HBM)产品，并宣称是全球首款采用2Gb、20nm节点制造的8Gb DDR4 SDRAM模块。 最近，该公司在 …
DRAM前沿技术——IGZO DRAM文献笔记 - 知乎 - 知乎专栏
根据图1中TechInsights公布的DRAM Cell Roadmap，基于IGZO TFT的DRAM存储单元将成为支撑DRAM尺寸继续微缩的重要候选技术。 尤其是当下DRAM正处在特征尺寸从 6F^{2}向4F^{2}演 …
Microsphere-assisted hyperspectral imaging: super-resolution, non ...
2024年5月28日 · In this paper, we present the Microsphere-Assisted Hyperspectral Imaging (MAHSI) system, designed to drastically reduce the measurement spot size while maximizing …
Automatic DRAM cell location in the SEM - IEEE Xplore
This paper describes a vision-based system that automates the task of cell location without the need for a high-accuracy specimen stage. The algorithm makes use of cross-correlation to …
Metal Layer Monitoring in DRAM Production by use of …
Transmission electron microscope (TEM) cross-sections and SEM cross-sections are the two major techniques for obtaining detailed profile information. However, both they are destructive …
SEM images and process window of DRAM cell with 44nm
This paper proposed to implement a segmented-rotor high temperature superconducting (HTS) flux-switching (HTS-FS) generator with dual electrical ports for offshore wind power generation.
a) SEM image of the 2T0C DRAM cell with IGZO and ITO
Download scientific diagram | a) SEM image of the 2T0C DRAM cell with IGZO and ITO transistors as write and read devices, respectively. b) Circuit diagram of the 2T0C DRAM cell …
Ultra high resolution SEM observation of DRAM capacitors
The new CFE gun technology featured in the SU9000 is the solution for high resolution SEM imaging: thanks to a high source brightness and low energy spread this system has the …
Cross-sectional SEM image of topology between DRAM
Cross-sectional SEM image of topology between DRAM arrays and periphery region after triple metallization. [...] In this paper, a 0.15 μm embedded DRAM technology is described which …
DRAM capacitor-to-capacitor short process characterization via
2025年2月26日 · This study employs a high-resolution, high-throughput, large field of view (FOV) scanning electron microscopy (SEM) metrology system to investigate capacitor-to- capacitor …