Single crystals of pure and thallium (Tl) doped cesium iodide (CsI) have been grown by melt growth (Bridgman) technique. The grown crystals were subjected to powder X-ray diffraction and...

2014年2月1日 · In the present work, cesium iodide (CsI) thin films of different thicknesses have been prepared by thermal evaporation technique. The crystallite size and grain size of these films are compared by using X-ray diffraction (XRD) profile analysis as well as by transmission electron microscopy (TEM) counting, respectively.

Thin films of cesium iodide (CsI) were deposited by pulsed laser deposition and by thermal evaporation onto Si substrates and were characterized by x-ray diffraction, x-ray photoelectron...

2019年10月27日 · At first, the CsIO 3 XRD peak appears for the CsI film as oxygen species react with CsI during deposition because of the absorption of molecular H 2 O. Since the surface is protected by the parylene-N layer, there is no Cs 2 O at 2θ = 51° in the XRD pattern .

2021年8月1日 · The effect of CsI intercalation on the crystallization of the series of perovskite films was also assessed using XRD analyses, and Fig. 5 a presents the XRD patterns obtained from the various specimens. Diffraction peaks are present at 2θ values of 14.01°, 20.01°, 28.4° and 31.91° in each of the patterns, corresponding to the (110), (112 ...

CsI, CsBr and GaAs thin films have been grown by pulsed laser deposition on glass substrates. The morphology and structure of the films have been studied using X-ray diffraction and scanning...

本文采用扫描电子显微镜（ sem )、 x 射线衍射仪（ xrd )、高阻仪、 红外分光光度计 研究了 csi 薄膜的受潮现象，分析了颗粒生长动力学过程以及薄膜结晶取向、内应力及电阻率的变化，研究了薄膜吸附水的红外振动方式．研究结果对 csi 功能薄膜的设计制备与 ...

2022年3月23日 · The presence of thallium in the samples was confirmed by ICP-MS, and the form of Tl in CsI(Tl) was predicted by XRD. Excitation and emission spectra were measured to determine the excitation wavelength and emission wavelength of the sample.

Powder CsI crystal has been deposited with vacuum thermal evaporation on three different kinds of substrates: Si, SiO2/Si and Pt/Si. We have analyzed and observed these CsI films with different depth and various preparation conditions by XRD measurement.

Films of CsI:Tl are widely used for the X-ray imaging in medical diagnostics [1]. These films grow in a columnar structure that provides a high special resolution required for the imaging application. The CsI:Tl exhibits an emission at 550 nm that matches with the photodiode and CCD readouts. Films of CsI:Tl can be deposited