The C1s spectrum from a sample with high concentration of sp 2 carbon will have a broad, asymmetric tail towards higher binding energy. One or more satellite features, several eV from the main C1s peak, will also be observed in samples with high sp 2 concentration.

xps 光谱解读. 外来碳污染通常用作 xps 能谱的荷电基准。 外来 c1s 谱图通常有 c、c-o-c 和 o-c=o 峰。 默认情况下，可将 c-c 峰的结合能设置为 284.8 ev。 但该荷电基准值并非一直有效（例如：铝天然氧化物上的外来碳的 c1s 峰出现在约 286 ev 处）。

2016年6月4日 · X-ray photoelectron spectroscopy (XPS) is a widely used tool for studying the chemical composition of materials and it is a standard technique in surface science and technology. XPS is particularly useful for characterizing nanostructures such as carbon nanomaterials due to their reduced dimensionality.

2020年7月21日 · X-ray photoelectron spectroscopy (XPS) test is one of the most significant characterization methods to analyze the surfaces. The carbon species and banding energies for several typical kinds of carbon materials (graphite, carbon black, graphene, carbon nanotubes, carbides, and polymers) were summarized with typical XPS spectra.

xps分析では、ピーク位置（結合エネルギー）から元素の化学結合状態を評価でき、ピーク面積比から各化学結合状態の割合を把握することができます。

X-ray photoelectron spectroscopy (XPS or ESCA) curve fitting procedures, reference materials and useful notes are listed here to provide a starting point for the consistent interpretation of XPS spectra. These reference pages contain tips and techniques that are designed to help both the novice and advanced XPS user.

The XPS C1s peaks at 284.0 eV, 286.1 eV and 295.5 eV are associated with sp 2 and sp 3 -hybridized carbon (C C and C C), hydroxyl/phenols (C OH) and carboxyl (O C O) groups, respectively.

High-resolution XPS O 1s spectra obtained from Pd 80 In 20 /HAp displayed two deconvoluted peaks at binding energy of 530.8 and 532.4 eV associated with C]O and OeC]O [75] (Fig. 3c). ...

2020年7月21日 · The X-ray photoelectron spectroscopy (XPS) reveals that for Mo 3d is found to be two characteristics peaks at 231.2 eV and 233.2 eV corresponds to Mo 4+ 3d 3/2 and 3d 5/2 respectively.

2021年1月6日 · In this guide, we describe and explain the most common problems associated with C 1s narrow scan analysis in the XPS literature. We then provide an overview of rules, principles, and considerations that, taken together, should …