Researchers at Nagoya University in Japan used atomic-resolution secondary electron (SE) imaging to capture the atomic structure of the very top layer of materials to better understand the ...
Jeol JSM-6010LV High performance, fast imaging microscope with adjustable high and low vacuum settings (variable pressure), secondary electron imaging and three types of backscattered electron imaging ...
Simple node module to download the ChromeDriver version for Electron. You can set the ELECTRON_MIRROR or NPM_CONFIG_ELECTRON_MIRROR environment variables to use a ...
Field Emission Scanning Electron Microscope (FESEM) Zeiss Supra 35 SEM (w/ Noran System 6 EDS) Materials Characterization Microstructural, structural and chemical microanaysis of materials (1 nm ...