or vertical scanning interferometry (which requires vertical scanning of the sample or objective), DHM allows 3D reconstruction of the surface topography through a single image acquisition ...

(c) Topography measured for the same region on the sample surface as shown in (b). (d) Mechanical modulus for the ...

Right: Current through the film of the area inside the blue rectangle in the topography. (Image: Nanosurf) In C-AFM, a conductive AFM probe, typically made of silicon or silicon nitride and coated ...

As the requirement for nanoscale material characterization and elemental topography measurements ... to image the elemental composition of a sample surface and establish topographical sample ...

Zeta-20 3D measurement of microneedles topography ... ideal for nanometer-level surface heights and roughness VSI vertical scanning interferometry is measures thin and thick features over a large ...