NPGS, Nanometer Pattern Generation System, allows a user to create a nanometer pattern on a specimen. Generally the beam parameters used are found on the last page of the FIB manual under the "Beam ...

The Electron Imaging and Holography Facility has become the Helium Ion Microscopy Facility. Two of the previous major microscopes (SEM/FIB and Tecnai F20) were sold or retired. The feasibility of ...