Semiconductor industry is moving towards the ... A larger polysilicon (gate) critical dimension (CD) variation affects the product performance, power and leakage. Deep sub micron technology nodes have ...

(Image: Hitachi High-Tech) CD-SEM is an essential metrology tool in semiconductor manufacturing ... CD-SEM is used to measure the width of nanoscale transistor gates, ensuring they meet the design ...

In the case of Brattain's transistor, current flowed towards the second gold contact. Think about what that means. A small current in through one contact changes the nature of the semiconductor so ...

The semiconductor industry has maintained this rate of transistor dimension scaling ... efficiency (about 0.5% for 2.48 nm) remains a critical point.

Founded in 1955, Shockley Semiconductor was the brainchild of William Shockley. When he was ready to leave Bell Labs, he decided to form a company to build transistors. Funded by Beckman ...

Researchers at Stanford University recently introduced a CMOS-compatible approach to engineer the tensile strain (i.e., stretchiness) in monolayer semiconductor transistors. This approach ...