In particular, interest in non-contact metrology for measurement of different types of microelectromechanical-system (MEMS) devices has risen. Such metrology can help resolve MEMS fabrication ...

Interference between these two beams is then measured in order to form an interferogram from which height calculations can be obtained. Request a Quote for Optical Non-contact Profilers and ...

The measuring value can be shown on a display or released as an analog output signal, which supports a simple connection to control process management systems. Infrared System. Image Credit: Optris ...

The Group employs over 450 people and boasts active customers in 37 countries. With a railway diagnostics products portfolio spanning from non-contact measuring systems (more than 60 different types) ...