The PHI 5800 X-ray photoelectron spectrometer (XPS) is equipped with a dual source anode (Al and Mg), a hemispherical analyzer for XPS and Auger electron spectroscopy (AES) analysis, including ...

X‐ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) are just two techniques which rely on the detection of electrons for the analysis of surfaces. There are several more. To ...

(Image: A. Carlson, Wikimedia Commons, in the public domain) Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS) are both essential for analyzing material surfaces, offering ...

Electron spectroscopy for chemical analysis (ESCA), is a widely used surface analysis technique for materials characterisation. This technique includes X-ray Photoelectron Spectroscopy (XPS) and Auger ...