The JEOL 1400 High Contrast Transmission Electron Microscope is a state-of-the-art imaging system designed for high-resolution transmission electron microscopy (TEM). This microscope features advanced ...

The JEOL TEM-F200 is a 200kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS).

This technique can be used to scan a larger area of the sample or a specific point when using a scanning TEM (STEM). In 2019, researchers at precision-instrument manufacturer JEOL Ltd. and the ...

The “F2” is a simple-to-use, exceptionally stable, high-resolution imaging and analytical 200kV TEM that incorporates the latest JEOL advancements. The F2 is a multi-purpose workhorse system with ...