The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...

Bruker's OptoVolt™ Module for Ultima 2Pplus multiphoton microscopes delivers unprecedented kilohertz imaging ... voltage indicators, it is even possible to measure neural activity with higher temporal ...

By controlling the ion beam parameters, such as beam current, accelerating voltage, and dwell time, precise milling or etching of the sample can be achieved at the nanoscale. FIB milling is ...