In this blog, we have covered our experience at eInfochips in addressing ATPG challenges at lower technology nodes. We speak from our direct experience being counted as one of the very few engineering ...

Design for testability is applied to test power management circuits using Power Test Access Mechanism. Also few methods are discussed to implement DFT to test power management circuitry and improve ...

Watch the video below, where Lee Harrison – Director of Automotive IC Solutions at Siemens EDA – explains the technology behind full In-System ATPG testing for advanced semiconductors Continuous ...